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Electrical Conduction Characteristic of a 2D MXene Device with Cu/Cr2C/TiN Structure Based on Density Functional

Lei Wang1, Jing Wen1, Yuan Jiang1

  • 1School of Information Engineering, Nanchang Hangkong University, Nanchang 330000, China.

Materials (Basel, Switzerland)
|August 23, 2020
PubMed

Keywords:
Cr2CMXenefirst-principle studymemristor

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