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Updated: Dec 10, 2025
Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses
Published on: June 7, 2018
Nanoscale Visualization of Phase Transition in Melting of Sn-Bi Particles by In situ Hard X-ray Ptychographic
Nozomu Ishiguro1,2, Takaya Higashino2,3, Makoto Hirose2,3
1Tohoku University, Institute of Multidisciplinary Research for Advanced Materials (IMRAM)2-1-1, Katahira, Aoba-ku, Sendai980-0857, Miyagi, Japan.
Abstract:
The phase transition in the melting of Sn–Bi eutectic solder alloy particles was observed by in situ hard X-ray ptychographic coherent diffraction imaging with a pin-point heating system. Ptychographic diffraction patterns of micrometer-sized Sn–Bi particles were collected at temperatures from room temperature to 540 K. The projection images of each particle were reconstructed at a spatial resolution of 25 nm, showing differences in the phase shifts due to two crystal phases in the Sn–Bi alloy system and the Sn/Bi oxides at the surface. By quantitatively evaluating the Bi content, it became clear that the nonuniformity of the composition of Sn and Bi at the single-particle level exists when the particles are synthesized by centrifugal atomization.
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