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Updated: Dec 10, 2025

A Technical Guide for Performing Spectroscopic Measurements on Metal-Organic Frameworks
Published on: April 28, 2023
A new Collinear Apparatus for Laser Spectroscopy and Applied Science (COALA).
K König1, J Krämer1, C Geppert2
1Institut für Kernphysik, Technische Universität Darmstadt, 64289 Darmstadt, Germany.
A novel collinear laser spectroscopy setup minimizes systematic uncertainties for precise frequency and high-voltage measurements. This advanced system, demonstrated with Ca+ and In+ ions, enhances accuracy in atomic spectroscopy and metrology.
Area of Science:
- Atomic Physics
- Laser Spectroscopy
- Metrology
Background:
- Collinear laser spectroscopy is a powerful technique for atomic studies.
- Existing setups face systematic uncertainties in high-voltage and frequency measurements, beam superposition, and residual gas collisions.
- These limitations hinder routine, high-accuracy measurements.
Purpose of the Study:
- To develop and present a new collinear laser spectroscopy setup.
- To overcome systematic uncertainty limits in high-voltage and frequency measurements.
- To enable routine, high-accuracy transition frequency determination and metrological applications.
Main Methods:
- Active stabilization of ion-source potential.
- Implementation of novel ion sources for collinear laser spectroscopy.
- Dedicated installations for pump-and-probe measurements.
- A versatile laser system referenced to a frequency comb.
- Accurate high-voltage measurement techniques.
Main Results:
- Demonstrated routine determination of transition frequencies with enhanced accuracy.
- Successfully performed accurate high-voltage measurements for metrological applications.
- Validated the setup's performance using Calcium ions (Ca+) and Indium ions (In+).
Conclusions:
- The new collinear laser spectroscopy setup significantly reduces systematic uncertainties.
- It enables routine, high-accuracy measurements previously unachievable.
- The system is suitable for both fundamental atomic physics research and metrological applications.
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