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Development of a light field measuring system with corrected distortion based on imaging analysis
Applied Optics
|September 9, 2020
Summary
This study introduces a light field measuring system that corrects aberrations caused by microlens array (MLA) errors. The developed system enhances 3D measurement accuracy by employing advanced imaging analysis techniques.
Area of Science:
- Optical Engineering
- Computational Imaging
- Metrology
Background:
- Light field microscopy enables 3D measurements via a single exposure using a microlens array (MLA).
- Aberrations introduced by MLA errors degrade image quality and impact measurement precision.
Purpose of the Study:
- To propose and validate a light field measuring system with aberration correction capabilities.
- To investigate and quantify the impact of MLA errors on light field measurements.
Main Methods:
- Utilized computational imaging for aberration correction.
- Employed an image segmentation and fusion distortion model to correct image distortion.
- Applied a gradient-based linear recognition algorithm to address MLA rotation errors.
Main Results:
- Simulations quantitatively analyzed the effects of MLA errors.
- The developed system demonstrated effective correction of aberrations.
- Experimental results confirmed improved measurement accuracy.
Conclusions:
- The proposed aberration correction algorithms significantly enhance the performance of light field measuring systems.
- Accurate 3D measurements can be achieved even with MLA imperfections.
