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Miniaturized Sample Preparation for Transmission Electron Microscopy
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Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic

Saeid Pourbabak1, Andrey Orekhov1, Dominique Schryvers1

  • 1EMAT, University of Antwerp, Antwerp, Belgium.

Microscopy Research and Technique
|September 11, 2020
PubMed

Keywords:
NiTiTEM specimen preparationmicrowirestwin-jet electropolishingundersized samples

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