Nanoscale crystal grain characterization via linear polarization X-ray ptychography

Zirui Gao1, Mirko Holler2, Michal Odstrcil2

  • 1Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. manuel.guizar-sicairos@psi.ch johannes.Ihli@psi.ch and ETH Zurich, Department of Information Technology and Electrical Engineering, 8093 Zurich, Switzerland.

Chemical Communications (Cambridge, England)
|October 8, 2020
PubMed