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Updated: Dec 6, 2025

Characterization of Nanocrystal Size Distribution using Raman Spectroscopy with a Multi-particle Phonon Confinement Model
Published on: August 22, 2015
Nanoscale crystal grain characterization via linear polarization X-ray ptychography
Zirui Gao1, Mirko Holler2, Michal Odstrcil2
1Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. manuel.guizar-sicairos@psi.ch johannes.Ihli@psi.ch and ETH Zurich, Department of Information Technology and Electrical Engineering, 8093 Zurich, Switzerland.
Abstract:
X-ray linear dichroism and X-ray birefringence microscopy are yet to be fully utilized as instruments in the microstructural characterization of crystalline materials. Here, we demonstrate analyser-free X-ray linear dichroism microscopy using spectroscopic hard X-ray ptychography. First experiments enabled a spectroscopic and microstructural characterisation of polycrystalline vanadium pentoxide on the nanoscale, outside of diffraction-contrast based methods.
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