Evaluation of biangular reflection photometry for quantitative study of etched alloy surface roughness

Biangular reflection photometry was correlated with quantitative stereology and direct pit-depth measurements for an electrolytically etched nickel-chromium-beryllium alloy. Effects of viewing angle, viewing aperture, and plane polarization of incident and viewing light were also studied. The results showed that architectural changes in the etched metal surface could be quantitatively described with the use of reflection photometry. An off-specular peak, located at an angle of reflection considerably different from the angle of incidence, was observed to have an intensity comparable with that of the specular reflection peak. Viewing aperture was found to affect one's ability to distinguish among degrees of surface roughness.