Atomic Force Microscopy
Super-resolution Fluorescence Microscopy
Phase Contrast and Differential Interference Contrast Microscopy
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Dec 5, 2025

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Chengmeng Li1, Yiping Cao2, Lu Wang1
1Department of Opto-Electronics, Sichuan University, Chengdu, 610064, China.
This study introduces a novel computer-generated moiré profilometry technique using algebraic addition for enhanced 3D surface measurement. The method improves accuracy by reducing noise and measuring complex objects effectively.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: