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Binarization of ESPI fringe patterns based on an M-net convolutional neural network
Applied Optics
|October 26, 2020
Summary
This study introduces a novel M-net convolutional neural network for binarizing noisy fringe patterns in electronic speckle pattern interferometry (ESPI). The method effectively segments complex patterns, improving phase term estimation in ESPI applications.
Area of Science:
- Optics and Photonics
- Computer Vision
- Image Processing
Background:
- Electronic speckle pattern interferometry (ESPI) relies on fringe patterns for phase term estimation.
- Traditional fringe binarization methods struggle with speckle noise and intensity variations inherent in ESPI.
- Accurate binarization is crucial for reliable fringe skeleton extraction and subsequent analysis.
Purpose of the Study:
- To develop an automated and robust method for binarizing challenging ESPI fringe patterns.
- To adapt and improve the M-net convolutional neural network for image segmentation tasks in optical metrology.
- To demonstrate the effectiveness of the proposed method compared to existing techniques.
Main Methods:
- A modified M-net convolutional neural network was employed, treating fringe pattern binarization as a segmentation problem.
- The network was trained using pairs of ESPI fringe patterns and their corresponding ground-truth binary images.
- The modified M-net's performance was evaluated against U-net and RED-net on simulated and experimental ESPI data.
Main Results:
- The proposed M-net method achieved accurate binarization of ESPI fringe patterns, even those with significant noise and intensity inhomogeneity.
- The method successfully produced good results without requiring prior image preprocessing steps.
- Comparative analysis showed the modified M-net outperformed U-net and RED-net in this specific application.
Conclusions:
- The modified M-net convolutional neural network offers an effective solution for robust ESPI fringe pattern binarization.
- This approach enhances the reliability of phase term estimation in ESPI, particularly in noisy conditions.
- The study highlights the potential of deep learning for advanced image processing in optical measurement techniques.

