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Updated: Dec 3, 2025

Selective Area Modification of Silicon Surface Wettability by Pulsed UV Laser Irradiation in Liquid Environment
Published on: November 9, 2015
Epitaxial Growth of Silicon on Silicon Wafers by Direct Laser Melting
Marie Le Dantec1, Mustafa Abdulstaar1, Marc Leparoux1
1Empa-Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Advanced Materials Processing, Feuerwerkerstrasse 39, CH-3602 Thun, Switzerland.
Abstract:
Additive manufacturing (AM) of brittle materials remains challenging, as they are prone to cracking due to the steep thermal gradients present during melting and cooling after laser exposition. Silicon is an ideal brittle material for study since most of the physical properties of single-element materials can be found in the literature and high-purity silicon powders are readily available. Direct laser melting (DLM) of silicon powder was performed to establish the conditions under which cracks occur and to understand how the solidification front impacts the final microstructure. Through careful control of process conditions, paying special attention to thermal gradients and the growth velocity, epitaxial pillars free of cracks could be grown to a length of several millimeters.
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