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High-dynamic range segmented mirror metrology by two-wavelength PISTIL interferometry: demonstration and performance
Optics Express
|October 29, 2020
Summary
A new two-wavelength PISTIL interferometry method overcomes phase wrapping limitations for precise wavefront sensing. This high-dynamic range technique accurately measures phase delays and tilts in segmented surfaces for optics applications.
Area of Science:
- Optical metrology
- Wavefront sensing
- Interferometry
Background:
- PISTIL interferometry is used for wavefront sensing of segmented surfaces in astronomy, lasers, and ophthalmology.
- Traditional interferometry faces dynamic range limitations due to 2π phase wrapping ambiguity.
Purpose of the Study:
- To introduce a two-wavelength version of PISTIL interferometry.
- To overcome the dynamic range limitations of conventional phase wrapping.
Main Methods:
- Development of a two-wavelength PISTIL interferometer.
- Experimental validation using a PTT-111 deformable mirror.
- Comparison with a reference phase-shifting interferometer.
Main Results:
- The two-wavelength PISTIL interferometry effectively bypasses the 2π phase ambiguity.
- Measurements of piston errors achieved precision and accuracy below λ/100.
- Experimental results were validated against a reference interferometer.
Conclusions:
- The two-wavelength PISTIL interferometry is a high-dynamic range technique for precise wavefront sensing.
- This method offers superior performance compared to traditional approaches for segmented surface analysis.
