Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

14.2K
The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
14.2K
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

4.9K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
4.9K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Silicon-hydroxyapatite‒glycerohydrogel as a promising biomaterial for dental applications.

Colloids and surfaces. B, Biointerfaces·2020
Same author

Low loss optical waveguides fabricated in LiTaO<sub>3</sub> by swift heavy ion irradiation.

Optics express·2019
Same author

[Combined subchronic toxicity of nickel and manganese oxides nanoparticles, and its decrease due to bioprotectors complex].

Meditsina truda i promyshlennaia ekologiia·2018
Same author

[Increasing resistance against hazardous effects of metals-containing nanoparticles as a prospective approach to health risks management].

Meditsina truda i promyshlennaia ekologiia·2018
Same author

Quantitative characterization of the ionic mobility and concentration in Li-battery cathodes via low frequency electrochemical strain microscopy.

Nanoscale·2018
Same author

Structural, magnetic, magnetocaloric and specific heat investigations on Mn doped PrCrO<sub>3</sub> orthochromites.

Journal of physics. Condensed matter : an Institute of Physics journal·2017

Related Experiment Video

Updated: Dec 2, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

13.3K

Local electronic transport across probe/ionic conductor interface in scanning probe microscopy.

K N Romanyuk1, D O Alikin2, B N Slautin2

  • 1School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, Russia; Department of Physics and CICECO - Aveiro Institute of Materials, University of Aveiro, 3810-193 Aveiro, Portugal.

Ultramicroscopy
|November 1, 2020
PubMed
Summary

Charge carrier transport significantly impacts atomic-force-microscopy (AFM) measurements. This study analyzes conductive-AFM (C-AFM) data, revealing how surface layers affect ion dynamics and electromechanical signals in Li1-xMn2O4.

More Related Videos

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

10.1K
Applications of the Single-probe: Mass Spectrometry Imaging and Single Cell Analysis under Ambient Conditions
15:00

Applications of the Single-probe: Mass Spectrometry Imaging and Single Cell Analysis under Ambient Conditions

Published on: June 14, 2016

11.1K

Related Experiment Videos

Last Updated: Dec 2, 2025

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

13.3K
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

10.1K
Applications of the Single-probe: Mass Spectrometry Imaging and Single Cell Analysis under Ambient Conditions
15:00

Applications of the Single-probe: Mass Spectrometry Imaging and Single Cell Analysis under Ambient Conditions

Published on: June 14, 2016

11.1K

Area of Science:

  • Materials Science
  • Surface Science
  • Nanotechnology

Background:

  • Charge carrier transport across the probe-sample junction is critical for atomic-force-microscopy (AFM) measurements.
  • Understanding these transport phenomena is essential for accurate electrical and electromechanical AFM data interpretation.

Purpose of the Study:

  • To investigate the influence of charge carrier transport on AFM measurements.
  • To analyze the interplay between surface layer properties and bulk ion dynamics in Li1-xMn2O4.
  • To develop an analytical framework for interpreting conductive-AFM (C-AFM) data.

Main Methods:

  • Conductive-AFM (C-AFM) measurements of local current-voltage (I-V) curves and their derivatives.
  • Analysis of Li1-xMn2O4 samples, a mixed ionic-electronic conductor.
  • Development of an analytical framework accounting for surface layer resistance and ion redistribution.

Main Results:

  • The conductance mechanism in the surface layer transitions from Pool-Frenkel to space-charge-limited current with increasing probe voltage.
  • The surface layer significantly modifies ion dynamics in the sample bulk.
  • A decrease in the effective electromechanical AFM signal due to ionic motion was observed.

Conclusions:

  • The developed framework aids in analyzing electronic transport mechanisms at the probe/sample interface.
  • Charge transport plays a crucial role in electric field distribution and mechanical responses in AFM.
  • This approach is applicable to a wide range of conducting materials in AFM studies.