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Updated: Nov 30, 2025

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
Published on: December 2, 2022
Liangdong Sun1,2, Hongcheng Gu1,2, Xiaojiang Liu1,2
1State Key Laboratory of Bioelectronics, School of Biological Science and Medical Engineering, Southeast University, 210096, Nanjing, China.
Researchers developed novel atomic force microscopy (AFM) tips using architectured materials to reduce image distortions. These energy-absorbing tips improve imaging quality by minimizing mechanical interactions during scanning.
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