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Evaluation and application of a new scintillator-based heat-resistant back-scattered electron detector during heat

R Podor1, J Mendonça1,2, J Lautru1

  • 1ICSM, Univ Montpellier, CNRS, ENSCM, CEA, Bagnols sur Cèze, France.

Journal of Microscopy
|November 20, 2020
PubMed

Keywords:
VP-SEMbackscattered electronshigh temperaturein situscanning electron microscopy

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