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X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
Published on: August 20, 2019
Davide Curcio1, Alfred J H Jones1, Ryan Muzzio2
1Department of Physics and Astronomy, Interdisciplinary Nanoscience Center, Aarhus University, 8000 Aarhus C, Denmark.
Researchers developed a new method using nanoscale light spots to study how electrical currents affect material properties. This technique reveals local details about electronic behavior and material defects under current flow.
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