Biasing of Metal-Semiconductor Junctions
Metal-Semiconductor Junctions
Biasing of P-N Junction
P-N junction
Schottky Barrier Diode
Induced Electric Dipoles
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Nov 25, 2025

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Yaping Zang1, E-Dean Fung1, Tianren Fu2
1Department of Applied Physics, Columbia University, New York, New York 10027, United States.
Investigating single diketopyrrolopyrrole (DPP) molecules with scanning tunneling microscope break junction (STM-BJ) revealed that high electrical bias induces backbone planarization. This structural change, crucial for molecular electronics, is linked to charge transport and junction reorganization.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: