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Empirical beam hardening and ring artifact correction for x-ray grating interferometry (EBHC-GI)
Brandon J Nelson1,2, Shuai Leng2, Elisabeth R Shanblatt2
1Graduate Program in Biomedical Engineering and Physiology, Mayo Clinic Graduate School of Biomedical Sciences, Rochester, MN, 55905, USA.
Medical Physics
|December 18, 2020
Summary
This study introduces a new method to correct beam hardening artifacts in Talbot-Lau grating interferometry, significantly improving image quality for polychromatic x-ray imaging. The technique effectively reduces spectral artifacts in absorption, phase, and visibility contrasts.
Area of Science:
- Medical Imaging
- X-ray Physics
- Materials Science
Background:
- Talbot-Lau grating interferometry (TLGI) utilizes polychromatic x-ray sources for enhanced phase contrast imaging.
- Polychromatic sources introduce beam hardening artifacts from both samples and gratings, degrading image quality.
- Existing methods struggle with spectral nonuniformity artifacts caused by grating imperfections and differing contrast energy dependencies.
Purpose of the Study:
- Develop and validate a correction strategy for grating-based x-ray imaging.
- Address beam hardening artifacts originating from both the imaged object and the interferometer gratings.
- Improve image quality in absorption, phase, and visibility contrasts.
Main Methods:
- Employed a two-variable polynomial expansion strategy, adapted for multicontrast TLGI.
- Determined correction coefficients empirically via calibration scans.
- Validated the method using micro-computed tomography (CT) on water, silicon, and murine lung samples.
Main Results:
- Achieved significant reductions in spectral artifacts, including cupping and ring artifacts.
- Reduced Mean Squared Error (MSE) by up to 96% across different contrasts.
- Demonstrated effective artifact removal in absorption, phase, and visibility images of various materials.
Conclusions:
- The developed method successfully removes beam hardening artifacts in TLGI.
- The approach is robust and applicable to various materials and imaging systems.
- Requires only system-specific calibrations, without needing detailed spectral or material information.
