Related Experiment Video
Updated: Nov 25, 2025

Visualization of Low-Level Gamma Radiation Sources Using a Low-Cost, High-Sensitivity, Omnidirectional Compton Camera
Published on: January 30, 2020
Using Geant4 Monte Carlo toolkit to evaluate a low power X-ray tube generator configuration
G Hoff1, E E Streck2, A Lai3
1Physics Department, University of Cagliari, Monserrato, Italy; Department of Cagliary, National Institute of Nuclear Physics, Monserrato, Italy; Medical Physics and Radioprotection Service, Hospital de Clínicas de Porto Alegre, Porto Alegre, Brazil.
Abstract:
Monte Carlo technique has been widely used as an important tool to develop new irradiation equipment, prototype medical equipment parts, and test methodologies for dosimetry. In this manuscript, we present a methodology to design a low power X-ray tube generator using the Geant4 Monte Carlo toolkit. The simulations were performed considering a large number of variables, namely, the material composition of the target track, the window thickness, and the air pressure of the X-ray tube. The X-ray production was simulated considering monoenergetic electron beams impinging on targets of tungsten and copper with incident kinetic energies ranging from 20 keV to 60 keV and initial divergences from 5° to 30°. For the polyenergetic emission, a conservative approach with Gaussian energy distribution was adopted. The analysis indicates that among the evaluated parameters, the incident kinetic energy, and the target material produced the most notable changes in the spectra shape and conversion efficiency (CE), significantly impacting the X-ray tube design. The studies provide a reliable methodology to explore general configurations for X-ray tube generators, defining the best geometry, material compositions, and thicknesses to be used on spectroscopy applications.
More Related Videos
14:19A Basic Positron Emission Tomography System Constructed to Locate a Radioactive Source in a Bi-dimensional Space
Published on: February 1, 2016
10:23Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
Published on: June 23, 2023