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Back-of-the-envelope image resolution estimation using an aberrated Rayleigh criterion
Applied Optics
|December 28, 2020
Summary
This study presents simple calculations for estimating optical imaging sensor point-spread function (PSF) size. These methods aid in allocating blur budgets for improved image quality in non-diffraction-limited systems.
Area of Science:
- Optical Engineering
- Image Sensor Technology
- Metrology
Background:
- Image quality in optical imaging sensors is paramount, directly correlating with sensor performance.
- Key factors influencing image quality include the point-spread function (PSF), sampling, and signal-to-noise ratio.
- Sensor resolution is critically dependent on the PSF, which is often degraded from the diffraction limit by optical aberrations and pixel size.
Purpose of the Study:
- To develop simplified, back-of-the-envelope calculations for estimating the PSF size of non-diffraction-limited imaging sensors.
- To provide a method for allocating blur contributions from various sources (e.g., wavefront errors) during sensor design.
- To enable better prediction and control of image quality based on required sensor resolution.
Main Methods:
- Development of two distinct, simplified calculation methods for estimating non-diffraction-limited PSF size.
- Utilizing sensor-level required resolution as the primary input for the PSF size estimation.
- Establishing a framework for allocating blur budgets to specific optical and sensor parameters.
Main Results:
- Successful derivation of two practical calculation methods for estimating imaging sensor PSF size.
- Demonstrated that these estimates can guide the allocation of blur contributions during the sensor design process.
- Provided a quantitative approach to manage trade-offs between resolution and various blur sources.
Conclusions:
- The developed calculations offer a valuable tool for optical imaging sensor design and performance prediction.
- Effective PSF size estimation facilitates the management of blur budgets, leading to optimized image quality.
- This approach aids engineers in addressing non-diffraction-limited scenarios by systematically allocating design parameters.
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