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Swept-Source-Based Chromatic Confocal Microscopy.

Dawoon Jeong1, Se Jin Park1, Hansol Jang1

  • 1Department of Cogno-Mechatronics Engineering, Pusan National University, Busan 46241, Korea.

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|December 29, 2020
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Summary
This summary is machine-generated.

This study introduces swept-source-based chromatic confocal microscopy (SS-CCM) for faster 3D surface profiling. The novel SS-CCM system achieves high-speed imaging with improved intensity and sensitivity.

Keywords:
3D surface profilechromatic aberrationchromatic confocal microscopyhigh-speedswept-sourcewavelength-swept laser

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Area of Science:

  • Optics and Photonics
  • Microscopy Techniques
  • Surface Metrology

Background:

  • Chromatic confocal microscopy (CCM) utilizes axial chromatic aberration for focal scanning.
  • Conventional CCM with broadband light sources and spectrometers faces limitations in imaging speed.
  • Advancements are needed for rapid three-dimensional (3D) surface profiling.

Discussion:

  • The proposed swept-source-based CCM (SS-CCM) system replaces broadband light with a swept-source, enabling higher intensity and narrower linewidth.
  • A single, fast photodetector acquires spectrally encoded depth information using a chromatic dispersive lens array, significantly enhancing data acquisition speed.
  • This approach overcomes the limitations of conventional CCM by streamlining spectral analysis and detection.

Key Insights:

  • SS-CCM demonstrates an axial chromatic focal distance range of approximately 360 μm within the 770-820 nm swept wavelength range.
  • High-speed 3D surface profiling was achieved, capturing images of a cover glass and coin in just 5 ms per position.

Outlook:

  • The SS-CCM system offers a promising advancement for rapid, high-resolution 3D surface metrology in various scientific and industrial applications.
  • Further optimization could lead to even faster imaging speeds and broader application ranges for advanced surface characterization.