Laser wavelength metrology with low-finesse etalons and Bayer filters

We present a wavelength meter with picometer-scale resolution based on etaloning effects of inexpensive glass slides and the built-in color filters of a consumer grade CMOS camera. After calibrating the device to a commercial meter, we tested the device's calibration stability using two tunable visible lasers for a period of over 16 days. The wavelength error over that entire period has a standard deviation of 5.29 parts per million (ppm) about a most probable error of 0.90 ppm. Within 24 hours of calibration, this improves to 0.04 ppm with a standard deviation of 3.94 ppm.