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Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
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Single-hemisphere photoelectron momentum microscope with time-of-flight recording
G Schönhense1, S Babenkov1, D Vasilyev1
1Johannes Gutenberg-Universität, Institut für Physik, 55128 Mainz, Germany.
The Review of Scientific Instruments
|December 31, 2020
Summary
We present a new photoelectron momentum microscopy method for full half-space mapping. This technique enhances angle-resolved photoelectron spectroscopy (ARPES) data acquisition efficiency and enables numerical correction of aberrations.
Area of Science:
- Surface Science
- Condensed Matter Physics
- Spectroscopy
Background:
- Photoelectron momentum microscopy is a powerful technique for angle-resolved photoelectron spectroscopy (ARPES).
- Existing methods often use double-hemispherical or time-of-flight (ToF) energy filters.
- Current instruments typically record kx-ky images within a single Brillouin zone.
Purpose of the Study:
- To introduce a novel approach for mapping the full half-space momentum.
- To demonstrate enhanced energy and angular resolution in photoelectron spectroscopy.
- To develop a method overcoming limitations in time-resolved ARPES experiments.
Main Methods:
- Utilized a large single hemispherical analyzer (225 mm path radius) for momentum mapping.
- Employed a He lamp for excitation, achieving 7.7 meV energy resolution.
- Introduced a dispersive-plus-ToF hybrid mode for 3D data acquisition (EB, kx, ky).
Main Results:
- Successfully performed k-imaging of quantum-well states in Au and Xe multilayers.
- Studied α²-aberration and transit-time spread over a wide pass-energy and angular range.
- Demonstrated numerical correction of detrimental aberration and spread effects for time-resolved studies.
Conclusions:
- The new method enables full half-space momentum mapping with high resolution.
- The dispersive-plus-ToF hybrid mode significantly enhances recording efficiency (up to N²).
- This technique is crucial for ARPES at high-pulse-rate sources like synchrotrons.
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