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Multi-slice ptychography enables high-resolution measurements in extended chemical reactors
Maik Kahnt1,2, Lukas Grote3,4, Dennis Brückner3,5
1Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607, Hamburg, Germany. maik.kahnt@maxiv.lu.se.
Scientific Reports
|January 16, 2021
Summary
Ptychographic X-ray microscopy can now achieve higher resolution for in situ chemical process imaging. A new multi-slice method accounts for wave propagation through thick samples, improving spatial resolution.
Area of Science:
- Materials Science
- Imaging Techniques
- Nanotechnology
Background:
- Ptychographic X-ray microscopy enables in situ observation of chemical processes.
- Thick chemical reactors limit spatial resolution due to limited depth of field.
- Wave propagation effects within sample environments are critical for high-resolution imaging.
Purpose of the Study:
- To overcome resolution limitations in ptychographic X-ray microscopy for thick samples.
- To demonstrate the impact of wave propagation on image reconstruction.
- To validate a multi-slice approach for enhanced lateral spatial resolution.
Main Methods:
- Recorded ptychographic projections of copper(I) oxide nanocubes on a polyimide foil.
- Applied conventional ptychographic reconstruction.
- Utilized a multi-slice ptychographic reconstruction approach.
- Studied copper(I) oxide nanocubes in a liquid cell environment.
Main Results:
- Conventional reconstruction showed resolution limits due to foil thickness.
- Multi-slice reconstruction clearly separated and sharpened images of nanocubes on both sides of the foil.
- Demonstrated the necessity of multi-slice reconstructions for imaging chemical processes in liquid cells.
Conclusions:
- The multi-slice approach significantly enhances lateral spatial resolution in ptychographic X-ray microscopy.
- Accounting for wave propagation is crucial for accurate imaging of samples within thick environments.
- This method is vital for high-quality imaging of in situ chemical processes.
