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High-precision orientation mapping from spherical harmonic transform indexing of electron backscatter diffraction

Gregory Sparks1, Paul A Shade2, Michael D Uchic2

  • 1Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson AFB, OH 45433, USA; Department of Materials Science and Engineering, The Ohio State University, Columbus, OH 43210, USA.

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Summary
This summary is machine-generated.

This study enhances crystal orientation determination using spherical harmonic analysis of electron diffraction patterns, achieving 0.016° precision. This advancement significantly improves calculations of geometrically necessary dislocation density.

Keywords:
Dislocation densityElectron backscatter diffractionHigh resolution EBSDIndexingSpherical harmonic transform

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Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Accurate crystal orientation determination is crucial for understanding material properties.
  • Electron backscatter diffraction (EBSD) is a key technique, but its precision can be limited.
  • Geometrically necessary dislocation (GND) density is a critical microstructural parameter.

Purpose of the Study:

  • To investigate the angular precision of crystal orientation determination using cross-correlation of simulated and experimental electron diffraction patterns via spherical harmonic analysis.
  • To compare this precision with conventional Hough-transform indexing.
  • To determine the impact of precision on geometrically necessary dislocation density calculations.

Main Methods:

  • Cross-correlation of dynamically simulated and experimental electron diffraction patterns.
  • Spherical harmonic analysis for orientation determination.
  • Conventional Hough-transform indexing for comparison.
  • Calculation of geometrically necessary dislocation density.

Main Results:

  • Achieved a best angular precision of 0.016°, approaching state-of-the-art EBSD implementations.
  • This precision resulted in a noise floor for GND density calculations of approximately 5×10¹³ m⁻² at a 200 nm step size.
  • Conventional Hough-transform indexing yielded a lower precision of 0.156° and a higher GND noise floor of 6×10¹⁴ m⁻².
  • Presented experimental trade-off curves for precision versus data collection parameters.

Conclusions:

  • Spherical harmonic analysis offers significantly higher angular precision for crystal orientation determination compared to Hough-transform indexing.
  • The enhanced precision directly translates to a lower noise floor in geometrically necessary dislocation density calculations.
  • The study provides guidance for optimizing data collection strategies to achieve desired precision levels.