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Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
Published on: April 24, 2018
Design and development of a miniaturized multiaxial test setup for in situ x-ray diffraction experiments
Lalith Kumar Bhaskar1, Gobind Kumar1, Nedunchezhian Srinivasan1
1Laboratory for High Performance Ceramics, Department of Metallurgical and Materials, Engineering, Indian Institute of Technology Madras (IIT Madras), Chennai 600036, India.
A new multi-axial loading test setup accurately tests miniature samples under various stress states. This setup integrates with X-ray diffraction, validating stress measurements for advanced material analysis.
Area of Science:
- Materials Science
- Mechanical Engineering
- Experimental Mechanics
Background:
- Accurate material characterization under multi-axial stress states is crucial for engineering applications.
- Existing testing methods often require larger sample sizes or are limited in the stress states they can replicate.
- Miniature samples offer advantages in material savings and testing efficiency.
Purpose of the Study:
- To develop and validate a novel, stand-alone multi-axial loading test setup for miniature samples.
- To evaluate the setup's capability for uniaxial and biaxial stress states (tension and compression).
- To demonstrate the setup's in situ integration with X-ray diffraction for stress analysis.
Main Methods:
- Development of a custom-built multi-axial loading test apparatus.
- Testing of miniature samples under uniaxial tension, uniaxial compression, in-plane biaxial tension, and biaxial compression.
- Comparison of uniaxial test results with standard geometry tests on a universal testing machine.
- Utilizing digital image correlation (DIC) for full-field strain measurement during biaxial testing.
- Integration of the test setup with a laboratory X-ray diffractometer for in situ stress analysis.
Main Results:
- The custom setup demonstrated good agreement in stress-strain responses for uniaxial tests compared to standard methods.
- Digital image correlation confirmed strain homogeneity in the central gage section during biaxial loading.
- In situ X-ray diffraction measurements showed good agreement with load sensor data, validating stress calculations.
- The developed setup successfully tested miniature samples under diverse multi-axial stress conditions.
Conclusions:
- The novel multi-axial loading test setup is a viable tool for characterizing miniature samples.
- The setup provides accurate and reliable stress-strain data for multiple stress states.
- The integration capability with X-ray diffraction enhances its utility for in situ stress analysis in materials research.
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