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General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers

Ari-Pekka Honkanen1, Simo Huotari1

  • 1Department of Physics, University of Helsinki, PO Box 64, FI-00014 Helsinki, Finland.

Iucrj
|February 1, 2021
PubMed

Keywords:
free-electron lasershard X-ray spectrometryspherically bent single crystalstoroidally bent single crystals

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