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Updated: Nov 19, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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Ionic charge distributions in silicon atomic surface wires

Jeremiah Croshaw1, Taleana Huff2, Mohammad Rashidi3

  • 1Department of Physics, University of Alberta, Edmonton, Alberta T6G 2J1, Canada. rwolkow@ualberta.ca and Quantum Silicon Inc., Edmonton, Alberta T6G 2M9, Canada.

Nanoscale
|February 3, 2021
PubMed

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