Semiconductors
Charge on a Conductor
Electric Field at the Surface of a Conductor
Continuous Charge Distributions
Equipotential Surfaces and Conductors
Types of Semiconductors
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Updated: Nov 19, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Jeremiah Croshaw1, Taleana Huff2, Mohammad Rashidi3
1Department of Physics, University of Alberta, Edmonton, Alberta T6G 2J1, Canada. rwolkow@ualberta.ca and Quantum Silicon Inc., Edmonton, Alberta T6G 2M9, Canada.
Researchers used non-contact atomic force microscopy to observe new ionic charge patterns in dangling bond silicon wires. These patterns depend on wire charge and lattice flexibility, revealing insights into surface phase formation.
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