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Scanning-probe Single-electron Capacitance Spectroscopy

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Published on: July 30, 2013

Granular Hall Sensors for Scanning Probe Microscopy.

Roland Sachser¹, Johanna Hütner², Christian H Schwalb³

¹Institute of Physics, Goethe University, Max-von-Laue-Str. 1, 60438 Frankfurt am Main, Germany.

Nanomaterials (Basel, Switzerland)

|February 4, 2021

Summary

Researchers developed custom-made nanogranular ferromagnetic Hall devices using focused electron beam induced deposition (FEBID). This novel scanning Hall sensor technology enables tailor-made magnetic stray field measurements for thin films and nanostructures.

Keywords:

focused electron beam induced deposition granular ferromagnets scanning Hall probe microscopy

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Area of Science:

Materials Science
Nanotechnology
Condensed Matter Physics

Background:

Scanning Hall probe microscopy offers minimally invasive characterization of magnetic materials.
Current sensor probes, using spin-valve elements or bismuth (Bi), face limitations in geometric customization due to planar thin-film fabrication.
Adapting existing sensor geometries for specific applications is challenging.

Purpose of the Study:

To demonstrate tailor-made nanogranular ferromagnetic Hall devices fabricated by focused electron beam induced deposition (FEBID).
To optimize magnetic stray field sensitivity in situ after nanofabrication.
To present proof-of-principle results for a novel scanning Hall sensor.

Main Methods:

Fabrication of nanogranular ferromagnetic Hall devices using focused electron beam induced deposition (FEBID).
Direct-write nanofabrication allowing for custom probe geometries.
In situ optimization of sensor element sensitivity.

Main Results:

Successful fabrication of tailor-made nanogranular Hall devices for arbitrary probe geometries.
Demonstration of in situ sensitivity optimization post-fabrication.
Initial proof-of-principle results showcasing the novel scanning Hall sensor's capabilities.

Conclusions:

FEBID enables custom-designed nanogranular Hall sensors for scanning Hall probe microscopy.
This approach overcomes geometric limitations of traditional sensor fabrication.
The developed sensors offer a promising new tool for magnetic characterization.