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Updated: Nov 18, 2025

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Correction: Extracting viscoelastic material parameters using an atomic force microscope and static force

Cameron H Parvini1, M A S R Saadi1, Santiago D Solares1

  • 1Department of Mechanical and Aerospace Engineering, The George Washington University School of Engineering and Applied Science, 800 22nd St. NW, Suite 3000, Washington, DC 20052, United States.

Beilstein Journal of Nanotechnology
|February 10, 2021
PubMed

Keywords:
Kelvin–Voigtatomic force microscopy (AFM)creepforce mappingindentationstatic force spectroscopy (SFS)viscoelasticity

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