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Correction: Extracting viscoelastic material parameters using an atomic force microscope and static force
Cameron H Parvini1, M A S R Saadi1, Santiago D Solares1
1Department of Mechanical and Aerospace Engineering, The George Washington University School of Engineering and Applied Science, 800 22nd St. NW, Suite 3000, Washington, DC 20052, United States.
Beilstein Journal of Nanotechnology
|February 10, 2021
Summary
This study corrects a previously published article DOI. The correction ensures accurate citation and retrieval of scientific information in nanotechnology research.
Area of Science:
- Nanotechnology
- Materials Science
Context:
- Correction of a previously assigned Digital Object Identifier (DOI).
- Ensuring accurate referencing for scientific literature.
Purpose:
- To rectify an error in the article's DOI.
- To facilitate correct identification and access to the research article.
Summary:
- The article DOI: 10.3762/bjnano.11.77 has been corrected.
- This ensures proper citation and retrieval of the associated research.
Impact:
- Improved accuracy in scientific literature databases.
- Enhanced discoverability and accessibility of nanotechnology research.
Keywords:
Kelvin–Voigtatomic force microscopy (AFM)creepforce mappingindentationstatic force spectroscopy (SFS)viscoelasticity
