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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Nov 18, 2025

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

Correction: Extracting viscoelastic material parameters using an atomic force microscope and static force

Cameron H Parvini¹, M A S R Saadi¹, Santiago D Solares¹

¹Department of Mechanical and Aerospace Engineering, The George Washington University School of Engineering and Applied Science, 800 22nd St. NW, Suite 3000, Washington, DC 20052, United States.

Beilstein Journal of Nanotechnology

|February 10, 2021

Summary

This summary is machine-generated.

This study corrects a previously published article DOI. The correction ensures accurate citation and retrieval of scientific information in nanotechnology research.

Keywords:

Kelvin–Voigt atomic force microscopy (AFM)creep force mapping indentation static force spectroscopy (SFS)viscoelasticity

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Last Updated: Nov 18, 2025

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

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Published on: March 16, 2020

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Area of Science:

Nanotechnology
Materials Science

Context:

Correction of a previously assigned Digital Object Identifier (DOI).
Ensuring accurate referencing for scientific literature.

Purpose:

To rectify an error in the article's DOI.
To facilitate correct identification and access to the research article.

Summary:

The article DOI: 10.3762/bjnano.11.77 has been corrected.
This ensures proper citation and retrieval of the associated research.

Impact:

Improved accuracy in scientific literature databases.
Enhanced discoverability and accessibility of nanotechnology research.