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Updated: Nov 17, 2025

Optimized Fabrication Procedure for High-Quality Graphene-based Moiré Superlattice Devices
Published on: July 11, 2025
Sihan Chen1, Jangyup Son1, Siyuan Huang1
1Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, United States.
Atomic force microscopy (AFM) tip-based cleaning enhances the performance of two-dimensional (2D) material electronic devices. This technique improves the electrical properties of molybdenum disulfide (MoS2) transistors by reducing interface contamination and disorder.
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