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X-ray microbeam diffraction in a crystal.

Vasily I Punegov¹, Andrey V Karpov¹

¹Institute of Physics and Mathematics, Federal Research Center `Komi Scientific Center', the Ural Branch of the Russian Academy of Sciences, Kommunisticheskaya Street 24, Syktyvkar 167982, Russian Federation.

Acta Crystallographica. Section A, Foundations and Advances

|March 1, 2021

Summary

This summary is machine-generated.

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Dynamical X-ray scattering in crystals was studied. For wide beams, geometrical optics and Fresnel approximation match, but narrow beams require accounting for diffraction at slit edges.

Area of Science:

Solid State Physics
Crystallography
X-ray Optics

Background:

Dynamical X-ray scattering is crucial for understanding crystal diffraction.
Spatially restricted X-ray fields present unique challenges in diffraction analysis.
Previous studies often simplified beam characteristics, neglecting edge effects.

Purpose of the Study:

To investigate microbeam diffraction in crystals using dynamical scattering theory.
To compare geometrical optics approximation (GOA) with Fresnel approximation (FA) for X-ray microbeams.
To analyze the impact of slit edges on diffraction patterns in confined X-ray geometries.

Main Methods:

Formalism of dynamical scattering of spatially restricted X-ray fields.
Application of geometrical optics approximation (GOA).

Keywords:

Fresnel approximation X-ray microbeams dynamical diffraction dynamical diffraction theory geometrical optics kinematical approximation reciprocal-space maps

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Application of Fresnel approximation (FA) including boundary functions for amplitudes.

Calculation of reciprocal-space maps and internal diffraction intensity distribution.

Main Results:

Angular intensity distributions in GOA and FA are similar for wide X-ray beams.
Diffraction at slit edges significantly affects narrow X-ray microbeams.
Detailed reciprocal-space maps and internal intensity distributions were computed.

Conclusions:

The choice of approximation (GOA vs. FA) depends on the X-ray beam's spatial restriction.
Edge diffraction effects are critical for microbeam analysis in crystals.
Accurate modeling requires considering wave nature of X-rays even in quasi-geometrical regimes.