X-ray Laue diffraction by sectioned multilayers. I. Pendellösung effect and rocking curves.

Area of Science:

• Condensed matter physics
• Materials science
• Crystallography

Background:

• X-ray dynamical diffraction is crucial for analyzing multilayer structures.
• The Takagi-Taupin equations provide a theoretical framework for understanding diffraction phenomena.
• Multilayer structures with varying depths and imperfections present unique analytical challenges.

Purpose of the Study:

• To theoretically investigate X-ray Laue dynamical diffraction in inhomogeneous flat and wedge multilayers.
• To analyze the influence of structural parameters on diffraction characteristics.
• To evaluate the accuracy of determining multilayer depths from experimental data.

Main Methods:

• Application of Takagi-Taupin equations for theoretical modeling.
• Derivation of recurrence relations for depth-inhomogeneous structures.
• Numerical simulations of W/Si and Mo/Si multilayer diffraction.
• Analysis of Pendellösung effect and rocking curves.

Main Results:

• Recurrence relations were derived for depth-inhomogeneous Laue diffraction.
• The impact of sectioned depth, imperfections, and period distribution on diffraction was studied.
• Numerical simulations were performed for W/Si and Mo/Si multilayers.
• The study revealed potential inaccuracies in determining sectioned depths from interference fringe periods.

Conclusions:

• The derived recurrence relations accurately describe Laue diffraction in complex multilayer systems.
• The distribution of multilayer periods and imperfections significantly affects diffraction patterns.
• Relying solely on interference fringe periods for sectioned depth determination can be unreliable.