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Updated: Oct 21, 2025

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
X-ray Laue diffraction by sectioned multilayers. I. Pendellösung effect and rocking curves
1Institute of Physics and Mathematics, Federal Research Center "Komi Scientific Center", The Ural Branch of the Russian Academy of Sciences, Syktyvkar 167982, Russian Federation.
Abstract:
Using the Takagi-Taupin equations, X-ray Laue dynamical diffraction in flat and wedge multilayers is theoretically considered. Recurrence relations are obtained that describe Laue diffraction in structures that are inhomogeneous in depth. The influence of sectioned depth, imperfections and non-uniform distribution of the multilayer period on the Pendellösung effect and rocking curves is studied. Numerical simulation of Laue diffraction in multilayer structures W/Si and Mo/Si is carried out. It is shown that the determination of sectioned depths based on the period of the interference fringes of the experimental rocking curves of synchrotron radiation is not always correct.
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