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Updated: Nov 15, 2025

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
Published on: April 24, 2018
X-ray microbeam diffraction in a crystal
Vasily I Punegov1, Andrey V Karpov1
1Institute of Physics and Mathematics, Federal Research Center `Komi Scientific Center', the Ural Branch of the Russian Academy of Sciences, Kommunisticheskaya Street 24, Syktyvkar 167982, Russian Federation.
Abstract:
Using the formalism of dynamical scattering of spatially restricted X-ray fields, the diffraction of a microbeam in a crystal with boundary functions for the incident and reflected amplitudes was studied in the case of geometrical optics and the Fresnel approximation (FA). It is shown that, for a wide front of the X-ray field, the angular distributions of the scattered intensity in the geometrical optics approximation (GOA) and the FA are approximately the same. On the other hand, it is established that, for a narrow exit slit in the diffraction scheme, it is always necessary to take into account the X-ray diffraction at the slit edges. Reciprocal-space maps and the distribution of the diffraction intensity of the microbeam inside the crystal were calculated.
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