Fault Detection Based on Multi-Dimensional KDE and Jensen-Shannon Divergence

Juhui Wei1, Zhangming He1,2, Jiongqi Wang1

  • 1College of Liberal Arts and Sciences, National University of Defense Technology, Changsha 410073, China.

Summary

This study introduces a new fault diagnosis method using optimal bandwidth kernel density estimation (KDE) and Jensen-Shannon (JS) divergence. The method significantly improves detection rates for both known and unknown faults in machinery.

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