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Characterization of Spatial Distribution of Trap Across the Substrate in Metal-Insulator-Semiconductor Structure with

Jintae Yu1, Han Bin Yoo1, Hae Sung Kim1

  • 1School of Electrical Engineering, Kookmin University, Seoul 02701, Korea.

Journal of Nanoscience and Nanotechnology
|March 14, 2021
PubMed

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