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Li Qiao1, Mingfu Wang2, Zheng Jin2
1Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, 610209, Sichuan, China. 834988645@qq.com.
A new method improves electron-multiplying charge-coupled device (EMCCD) image quality by accurately measuring electron multiplication gain. This correction significantly reduces image non-uniformity, enhancing signal stability and detector accuracy.
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