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Updated: Nov 10, 2025

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Single-shot spatial coherence characterization of x-ray ultrafast sources
This study introduces a new method for single-shot spatial coherence length measurement using a specialized aperture array. This technique is robust against beam variations and simplifies measurements in lensless imaging and metrology.
Area of Science:
- Optics and Photonics
- Coherence Theory
- Metrology
Background:
- Spatial coherence is critical for applications like lensless imaging, affecting image formation, especially with source variations.
- Current single-shot spatial coherence measurements often require parallel intensity data or multiple masks, limiting practicality.
- Robust characterization of spatial coherence is essential for advanced optical techniques.
Purpose of the Study:
- To develop a novel single-shot method for measuring spatial coherence length.
- To overcome limitations of existing techniques, such as the need for parallel intensity measurements or multiple masks.
- To create a robust method insensitive to beam-pointing instabilities.
Main Methods:
- Designed a two-dimensional non-redundant array of apertures for spatial coherence measurement.
- Utilized the far-field interference pattern generated by the aperture array.
- Adapted a method based on González et al. [J. Opt. Soc. Am. A28, 1107 (2011)] for single-shot analysis.
- Configured pinholes to decouple spatial coherence from intensity distribution.
Main Results:
- Achieved single-shot measurement of spatial coherence length.
- Demonstrated robustness against beam-pointing instabilities.
- Successfully disentangled spatial coherence from intensity distribution, eliminating the need for parallel intensity measurements.
- Experimentally validated the method using a high-harmonic source.
Conclusions:
- The proposed aperture array method enables efficient and robust single-shot spatial coherence characterization.
- This technique simplifies measurements in fields like lensless imaging and metrology.
- The method's insensitivity to source variations enhances its applicability in dynamic optical systems.
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