Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Infrared (IR) Spectroscopy: Overview01:09

Infrared (IR) Spectroscopy: Overview

3.7K
When electromagnetic radiation passes through a material, atoms or molecules transition from a lower to a higher energy state by absorbing radiation corresponding to the energy difference between the two states. The absorption of infrared (IR) radiation causes transitions between vibrational energy levels in a molecule. Therefore, IR spectroscopy is a useful analytical tool for determining the molecular structure of molecules.
Different compounds display unique properties due to their...
3.7K
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

10.5K
Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
10.5K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Robust Discriminant Subspace Learning With α-Divergence for Image Classification.

IEEE transactions on image processing : a publication of the IEEE Signal Processing Society·2026
Same author

Endoscopic Ultrasound of Pancreatic Tumors: A Dataset with Benchmarks for Convolutional Neural Network Classifiers.

Journal of imaging informatics in medicine·2025
Same author

Dual Focus-3D: A Hybrid Deep Learning Approach for Robust 3D Gaze Estimation.

Sensors (Basel, Switzerland)·2025
Same author

The Feasibility of RGB-D Gaze Intention Measurement in Children with Autism Using Azure Kinect.

Bioengineering (Basel, Switzerland)·2025
Same author

Enhancing Facial Expression Recognition through Light Field Cameras.

Sensors (Basel, Switzerland)·2024
Same author

Distortion Correction and Denoising of Light Sheet Fluorescence Images.

Sensors (Basel, Switzerland)·2024
Same journal

RETRACTED: Zhang et al. A Novel Framework for Reconstruction and Imaging of Target Scattering Centers via Wide-Angle Incidence in Radar Networks. <i>Sensors</i> 2025, <i>25</i>, 6802.

Sensors (Basel, Switzerland)·2026
Same journal

Enhancing Unsupervised Multi-Source Domain Adaptation for Person Re-Identification via Mixture of Experts and Graph-Based Relation.

Sensors (Basel, Switzerland)·2026
Same journal

Development of an Instrumented Glove for Palmar Pressure Assessment in Kayakers.

Sensors (Basel, Switzerland)·2026
Same journal

Development and Experimental Validation of an Autonomous IoT-Based Monitoring System for Real-Time Water Quality Assessment in the Amazon River.

Sensors (Basel, Switzerland)·2026
Same journal

Semi-Supervised Adversarial Learning Framework for Controller Area Network Bus Intrusion Detection.

Sensors (Basel, Switzerland)·2026
Same journal

Smart Optimization Method for Safety Signs in Innovative Manufacturing Environments Integrating Industrial Field IoT Sensors and Knowledge Graphs.

Sensors (Basel, Switzerland)·2026
See all related articles

Related Experiment Video

Updated: Nov 10, 2025

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings
09:01

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings

Published on: April 16, 2017

7.9K

Spatial Location in Integrated Circuits through Infrared Microscopy.

Raphaël Abelé1, Jean-Luc Damoiseaux1, Redouane El Moubtahij1

  • 1Laboratoire d'Informatique et Systemes, Aix-Marseille University, 163 Avenue de Luminy, 13288 CEDEX 09 Marseille, France.

Sensors (Basel, Switzerland)
|April 3, 2021
PubMed
Summary
This summary is machine-generated.

This study introduces an automated infrared microscopy method for locating structures in integrated circuits. The system enhances secure characterization by improving accuracy and speed in internal inspection.

Keywords:
autofocusgraph matchingmicroscopypattern locationpolynomial decompositionsecure characterizationthermal imaging

More Related Videos

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
08:46

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

Published on: April 13, 2016

10.3K
Microfabrication of Implantable Optics Integrated in a Microstructured Imaging Window for Advanced In Vivo Imaging
07:14

Microfabrication of Implantable Optics Integrated in a Microstructured Imaging Window for Advanced In Vivo Imaging

Published on: April 11, 2025

960

Related Experiment Videos

Last Updated: Nov 10, 2025

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings
09:01

High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings

Published on: April 16, 2017

7.9K
Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
08:46

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

Published on: April 13, 2016

10.3K
Microfabrication of Implantable Optics Integrated in a Microstructured Imaging Window for Advanced In Vivo Imaging
07:14

Microfabrication of Implantable Optics Integrated in a Microstructured Imaging Window for Advanced In Vivo Imaging

Published on: April 11, 2025

960

Area of Science:

  • Optics and Photonics
  • Electrical Engineering
  • Materials Science

Background:

  • Internal inspection of integrated circuits (ICs) is crucial for secure characterization.
  • Existing methods for locating internal structures in ICs face challenges with automation, accuracy, and speed.
  • Infrared microscopy offers a non-destructive approach for subsurface imaging of ICs.

Purpose of the Study:

  • To develop an automated infrared microscopy system for precise structure localization in integrated circuits.
  • To address challenges in focusing on conductive tracks beneath silicon layers.
  • To overcome issues of redundancy and noise in identifying structures on conductive tracks.

Main Methods:

  • Utilized a motorized optical system with an infrared uncooled camera and microscope.
  • Implemented an autofocus system employing discrete polynomial image transform for feature detection and focus metric generation.
  • Applied a graph-matching method with discriminating graph labels and a flexible assignment optimizer for structure location.

Main Results:

  • Achieved accurate feature detection and robust focus metric against image degradation.
  • Successfully discriminated graph labels to overcome redundancy in conductive track data.
  • Enabled inexact graph matching to mitigate noise, leading to precise structure identification.
  • Demonstrated increased accuracy and speed in the automated location process.

Conclusions:

  • The developed automated infrared microscopy system provides a reproducible and accurate method for secure integrated circuit characterization.
  • The autofocus and graph-matching techniques effectively address key challenges in internal IC inspection.
  • This approach significantly enhances the efficiency and reliability of integrated systems analysis.