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Demonstration of Three True Random Number Generator Circuits Using Memristor Created Entropy and Commercial
Scott Stoller1, Kristy A Campbell1
1Department of Electrical and Computer Engineering, Boise State University, Boise, ID 83725, USA.
Memristor-based true random number generator (TRNG) circuits were successfully built and tested. These circuits demonstrate the viability of memristors for creating reliable random number generation using simple, accessible components.
Area of Science:
- Electronics
- Materials Science
- Computer Science
Background:
- True Random Number Generators (TRNGs) are crucial for secure cryptographic applications.
- Memristors offer unique properties for novel electronic circuit designs.
- Previous research has explored memristor applications, but practical implementations require further validation.
Purpose of the Study:
- To construct and evaluate three memristor-based TRNG circuits.
- To assess the performance of these TRNGs using the NIST Statistical Test Suite (STS).
- To demonstrate the feasibility of using off-the-shelf components for memristor TRNGs.
Main Methods:
- Three distinct memristor-based TRNG circuits were designed and assembled.
- Circuits utilized commercially available memristors and standard breadboard components.
- The statistical randomness of the generated numbers was rigorously tested using the NIST STS.
Main Results:
- All three memristor-based TRNG circuits demonstrated successful functionality.
- The NIST STS confirmed the high quality of random numbers generated by the circuits.
- The study confirmed the effectiveness of memristors in TRNG implementations.
Conclusions:
- Memristors are a viable and effective component for building true random number generators.
- Simple circuit designs using readily available parts can yield functional memristor TRNGs.
- This work validates the practical application of memristors in secure random number generation.
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