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Published on: July 12, 2013
Silicon surface assisted laser desorption ionization mass spectrometry for quantitative analysis
Alexander A Grechnikov1, Alexey S Borodkov1, Yaroslav O Simanovsky2
1Vernadsky Institute of Geochemistry and Analytical Chemistry of the Russian Academy of Sciences, Moscow, Russia.
Abstract:
The approach to quantitative analysis by silicon Surface Assisted Laser Desorption Ionization Mass Spectrometry (Si-SALDI) is proposed. The approach is based on the new method for forming an active surface layer on a silicon substrate by exposing to laser radiation directly in the ion source of a mass spectrometer. The method can be used repeatedly on the same substrate, providing high reproducibility of its surface ionization properties and high ionization efficiency of organic compounds. Within the proposed approach, the methods of improvement of signal reproducibility are also considered, including continuous monitoring of the silicon surface ionization properties using a Knudsen effusion cell; scanning the surface of a silicon substrate with a laser beam; selecting the optimal value of laser fluence and using a reproducible sample introduction technique. It is demonstrated that this approach can be successfully applied to quantify clinically relevant concentrations of pharmaceutical drugs in extracts of blood.
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