Factors affecting Confidence Index in EBSD analysis

Automated EBSD analysis systems have been used for over two decades relying on the fact that the correctness of a particular orientation solution could be assessed through the calculation of a Confidence Index. However, such an index only reports whether a particular solution stands out among any other possible solutions, by receiving a larger number of votes than others, and does not necessarily imply that the corresponding orientation is correct. This issue is addressed in the present paper, where the correctness of solutions and the factors that might affect it have been studied for single crystal Si and polycrystalline Zn. The results were compared to those presented in previous papers where this matter was studied in particular for an FCC material. It was observed that about 90% of the solutions were correct if they were obtained using a confidence index of 0.1 using at least 8 Hough bands regardless of the crystallographic structure or orientation.