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Published on: May 29, 2014
A field programmable gate array based synchronization mechanism of analog and digital local oscillators in
Yu Zhao1, Peng Ye1, Kuojun Yang1
1School of Automaton, University of Electronic Science and Technology of China, Chengdu 611731, People's Republic of China.
This study presents a novel synchronization method for analog and digital local oscillators (LOs) in bandwidth-interleaved data acquisition systems (BI-DAQS). The technique ensures LO synchronization within each acquisition frame using Field Programmable Gate Arrays (FPGAs).
Area of Science:
- Electrical Engineering
- Signal Processing
- Digital Systems
Background:
- Bandwidth-interleaved data acquisition systems (BI-DAQS) require precise synchronization between analog and digital local oscillators (LOs).
- Random synchronization phase differences between LOs can degrade system performance across acquisition frames.
Purpose of the Study:
- To develop and validate an effective synchronization mechanism for analog and digital LOs in BI-DAQS.
- To analyze the random synchronization phase difference in BI-DAQS.
Main Methods:
- Analysis of synchronization phase differences between analog and digital LOs in BI-DAQS.
- Exploitation of the synchrony relation between the analog LO and the sampling clock.
- Implementation of synchronization in the Field Programmable Gate Array (FPGA) domain.
- Development of a BI-DAQS platform with 5.5 GHz bandwidth and 20 Gs/s sampling rate.
Main Results:
- Successful synchronization between analog and digital LOs is achieved within each acquisition frame.
- The proposed mechanism is validated on a high-performance BI-DAQS platform.
- The synchronization method demonstrates efficacy with minimal FPGA resource utilization (flip-flops and look-up tables).
Conclusions:
- The developed FPGA-based synchronization mechanism effectively addresses LO synchronization challenges in BI-DAQS.
- The approach is hardware-efficient, requiring no additional external components.
- This work contributes to improved performance and reliability in high-speed data acquisition systems.
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