Interlayer exchange couple based reliable and robust 3-input adder design methodology.

Venkat Mattela1, Sanghamitra Debroy1, Santhosh Sivasubramani1

  • 1Advanced Embedded Systems and IC Design Laboratory, Department of Electrical Engineering, Indian Institute of Technology, Hyderabad, India.

Nanotechnology
|April 29, 2021
PubMed
Summary

A new inter-layer exchange coupled (IEC) full adder design operates reliably at sub-50 nm, even at high temperatures. This novel design shows superior stability and energy efficiency compared to traditional dipole coupled adders for beyond CMOS devices.

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