Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Propagation of Uncertainty from Random Error00:59

Propagation of Uncertainty from Random Error

1.4K
An experiment often consists of more than a single step. In this case, measurements at each step give rise to uncertainty. Because the measurements occur in successive steps, the uncertainty in one step necessarily contributes to that in the subsequent step. As we perform statistical analysis on these types of experiments, we must learn to account for the propagation of uncertainty from one step to the next. The propagation of uncertainty depends on the type of arithmetic operation performed on...
1.4K
Propagation of Uncertainty from Systematic Error01:10

Propagation of Uncertainty from Systematic Error

1.1K
The atomic mass of an element varies due to the relative ratio of its isotopes. A sample's relative proportion of oxygen isotopes influences its average atomic mass. For instance, if we were to measure the atomic mass of oxygen from a sample, the mass would be a weighted average of the isotopic masses of oxygen in that sample. Since a single sample is not likely to perfectly reflect the true atomic mass of oxygen for all the molecules of oxygen on Earth, the mass we obtain from this...
1.1K
Cut-off Frequency of BJT01:17

Cut-off Frequency of BJT

1.0K
Cut-off frequencies in Bipolar Junction Transistors (BJTs) mark the transition between the signal's pass band and stop band, influencing their performance in amplifying or attenuating frequencies. These frequencies are crucial for designing BJTs to meet specific operational requirements in electronic circuits.
Alpha Cut-Off Frequency: Pertinent to the common-base configuration, the alpha cut-off frequency defines the upper-frequency limit at which the current gain, alpha, remains stable. As...
1.0K
Time and frequency -Domain Interpretation of Phase-lead Control01:24

Time and frequency -Domain Interpretation of Phase-lead Control

187
Phase-lead controllers are commonly used in various control systems to enhance response speed and stability. Adjusting the brightness on a television screen offers a practical example of phase-lead control. When contrast is enhanced, a phase-lead controller is employed. Mathematically, phase-lead control is identified when the first parameter is smaller than the second.
The design of phase-lead control involves the strategic placement of poles and zeros to balance steady-state error and system...
187
Uncertainty in Measurement: Reading Instruments02:46

Uncertainty in Measurement: Reading Instruments

48.9K
Counting is the type of measurement that is free from uncertainty, provided the number of objects being counted does not change during the process. Such measurements result in exact numbers. By counting the eggs in a carton, for instance, one can determine exactly how many eggs are there in the carton. Similarly, the numbers of defined quantities are also exact. For example, 1 foot is exactly 12 inches, 1 inch is exactly 2.54 centimeters, and 1 gram is exactly 0.001 kilograms. Quantities...
48.9K
Time and frequency -Domain Interpretation of Phase-lag Control01:21

Time and frequency -Domain Interpretation of Phase-lag Control

171
Phase-lag controllers are widely used in control systems to improve stability and reduce steady-state errors. A dimmer switch controlling the brightness of a light bulb serves as a practical example of phase-lag control, gradually adjusting the bulb's brightness. Mathematically, phase-lag control or low-pass filtering is represented when the factor 'a' is less than 1.
Phase-lag controllers do not place a pole at zero, but instead influence the steady-state error by amplifying any...
171

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Uncertainty Estimation for the Brillouin Frequency Shift Measurement Using a Scanning Tandem Fabry-Pérot Interferometer.

Micromachines·2023
Same author

Editorial for the Special Issue on High-Power Lasers for Materials Processing.

Micromachines·2023
Same author

Editorial for the Special Issue on Miniature Optoelectronic Resonators and Oscillators.

Micromachines·2022
See all related articles

Related Experiment Video

Updated: Nov 7, 2025

Quantum State Engineering of Light with Continuous-wave Optical Parametric Oscillators
09:23

Quantum State Engineering of Light with Continuous-wave Optical Parametric Oscillators

Published on: May 30, 2014

14.8K

Uncertainty Evaluation on a 10.52 GHz (5 dBm) Optoelectronic Oscillator Phase Noise Performance.

Patrice Salzenstein1, Ekaterina Pavlyuchenko1

  • 1Centre National de la Recherche Scientifique (CNRS), Franche-Comté Electronique Mécanique Thermique Optique Sciences et Technologies (FEMTO-ST) Institute, Université Bourgogne Franche-Comté (UBFC), F25000 Besançon, France.

Micromachines
|April 30, 2021
PubMed
Summary

A compact optoelectronic oscillator prototype generates a 10.52 GHz microwave signal. Its phase noise performance was evaluated using international metrology standards, achieving ±2 dB uncertainty.

Keywords:
microwave signaloptoelectronic oscillatoruncertaintyuncertainty analysis

More Related Videos

Fabrication and Testing of Microfluidic Optomechanical Oscillators
09:10

Fabrication and Testing of Microfluidic Optomechanical Oscillators

Published on: May 29, 2014

12.4K
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
05:57

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

8.2K

Related Experiment Videos

Last Updated: Nov 7, 2025

Quantum State Engineering of Light with Continuous-wave Optical Parametric Oscillators
09:23

Quantum State Engineering of Light with Continuous-wave Optical Parametric Oscillators

Published on: May 30, 2014

14.8K
Fabrication and Testing of Microfluidic Optomechanical Oscillators
09:10

Fabrication and Testing of Microfluidic Optomechanical Oscillators

Published on: May 29, 2014

12.4K
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
05:57

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

8.2K

Area of Science:

  • Photonics and Microwave Engineering
  • Metrology and Measurement Science

Background:

  • Optoelectronic oscillators (OEOs) are crucial for generating stable microwave signals.
  • Compact OEOs are highly sought after for various applications, including telecommunications and radar systems.
  • Accurate phase noise characterization is essential for evaluating oscillator performance.

Purpose of the Study:

  • To describe a prototype compact optoelectronic oscillator.
  • To evaluate the phase noise performance of the developed OEO.
  • To ensure the measurement uncertainty adheres to international metrology standards.

Main Methods:

  • Development of a prototype compact optoelectronic oscillator.
  • Measurement of the microwave signal's power and frequency (10.52 GHz, 5 dBm).
  • Phase noise evaluation and uncertainty calculation (±2 dB at 2 σ) following international metrology standards.

Main Results:

  • Successful demonstration of a compact optoelectronic oscillator prototype.
  • Generation of a microwave signal at 10.52 GHz with 5 dBm power.
  • Quantification of phase noise performance with a calculated uncertainty of ±2 dB at 2 σ.

Conclusions:

  • The prototype OEO shows promise for compact microwave signal generation.
  • The phase noise evaluation confirms the device's performance within established metrological frameworks.
  • This work contributes to the advancement of compact and reliable optoelectronic oscillator technology.