Combined laser-based X-ray fluorescence and particle-induced X-ray emission for versatile multi-element analysis

Area of Science:

• Physics
• Materials Science
• Analytical Chemistry

Background:

• Laser-based particle and radiation sources offer advanced capabilities for diverse applications.
• Intense laser-matter interactions generate energetic, high-brilliance sources with potential to surpass existing techniques.

Purpose of the Study:

• To demonstrate a versatile, non-destructive, and fast material analysis technique using laser-driven interactions.
• To enable seamless switching between Particle-Induced X-ray Emission (PIXE) and X-ray Fluorescence (XRF) within single laser shots.

Main Methods:

• Utilizing intense laser interaction with solid targets to generate particle and X-ray emissions.
• Modulating the atomic number of the target material to switch between PIXE and XRF detection modes.
• Performing volumetric analysis on areas up to cm² with a detection threshold of parts per million (ppm).

Main Results:

• A single laser shot can initiate both laser-driven PIXE and laser-driven XRF.
• Changing the target's atomic number allows for facile switching between the two analytical techniques.
• The combined approach enhances constituent retrieval and enables detailed volumetric analysis.

Conclusions:

• This novel technique offers a versatile, non-destructive, and rapid method for material analysis.
• The ability to combine PIXE and XRF enhances analytical capabilities for material characterization.
• The method is suitable for analyzing materials with high sensitivity and spatial resolution.