Low-Background Tip-Enhanced Raman Spectroscopy Enabled by a Plasmon Thin-Film Waveguide Probe

Kaifeng Zhang1,2, Yifan Bao3, Maofeng Cao3

  • 1Research & Development Group, Hitachi, Ltd., Yokohama 244-0817, Kanagawa, Japan.

Summary

This study introduces an indirect-illumination Tip-Enhanced Raman Spectroscopy (TERS) probe. This novel approach overcomes background noise, enabling high-contrast chemical analysis of challenging materials.