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Electrical Capacitance Characteristics of Wood Chips at Low Frequency Ranges: A Cheap Tool for Quality Assessment
Jakub Lev1, Václav Křepčík2, Egidijus Šarauskis3
1Department of Physics, Faculty of Engineering, Czech University of Life Sciences Prague, Kamýcká 129, 165 00 Prague, Czech Republic.
Abstract:
Moisture content is one of the most important parameters related to the quality of wood chips that affects both the calorific and economic value of fuel chips. For industrial applications, moisture content needs to be detected quickly. For this purpose, various indirect moisture content measurement methods (e.g., capacitance, NIR, microwave, ECT, X-ray CT, and nuclear MR) have been investigated with different results in the past. Nevertheless, determining wood chip moisture content in real time is still a challenge. The main aim of this article was therefore to analyze the dielectric properties of wood chips at low frequencies (10 kHz-5 MHz) and to examine the possibility of using these properties to predict wood chip moisture content and porosity. A container-type probe was developed for this purpose. The electrical capacitance and dissipation factor of wood chips with different moisture content was measured by an LCR meter at 10 kHz, 50 kHz, 100 kHz, 500 kHz, 1 MHz, and 5 MHz frequencies. Wood chip porosity was also measured using a gas displacement method. Linear models for moisture content and porosity prediction were determined by backward stepwise linear regression. Mathematical model was developed to better understand the physical relationships between moisture content, porosity, and electrical capacitance. These models were able to predict the moisture content of observed quantities of wood chips with the required accuracy (R2 = 0.9-0.99). This finding opens another path to measuring the moisture content and porosity of wood chips in a relatively cheap and fast way and with adequate precision. In addition, principal component analysis showed that it is also possible to distinguish between individual wood chip fraction sizes from the information obtained.
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