Recommended implementation of electrical resistance tomography for conductivity mapping of metallic nanowire networks

Alessandro Cultrera1, Gianluca Milano2,3, Natascia De Leo2

  • 1Quantum Metrology and Nanotechnologies, INRIM - Istituto Nazionale di Ricerca Metrologica, 10135, Turin, Italy. a.cultrera@inrim.it.

Scientific Reports
|June 24, 2021
PubMed