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Updated: Oct 31, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

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Weak ferroelectric charge transfer in layer-asymmetric bilayers of 2D semiconductors

Fábio Ferreira1,2, Vladimir V Enaldiev1,2,3, Vladimir I Fal'ko1,2,4

  • 1Department of Physics and Astronomy, University of Manchester, Manchester, M13 9PL, UK.

Scientific Reports
|June 29, 2021
PubMed

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